Scanning-Auger-Microscopy provides element specific pictures of the sample on a nano-scale with very high resolution. Aside of the secondary electrons used in the normal SEM mode for taking pictures, in SAM mode a special CMA detector differentiate the electrons ejected from the sample electrons according to their energies. This allows to map the surface for elements.
With the help of SAM we are able to determine the element composition of a surface and its compounds in sub-micron dimensions.
for information see chapter “Scanning Electron Microscopy”
By using the wide spectra of modern analytical methods and the excellent equipment present at Limedion, we will find an answer to all of your questions. The following methods are present in our labs:
According to requirements we use further methods e.g., High temperature infra-red camera, Ulbrich sphere, adhesion tester and salt spray cabinet.
