XPS/Auger: the characterization of surfaces
XPS is the spectroscopy of photoelectrons ejected out of a unknown sample exposed to x-ray radiation. The method is also known as ESCA (electron spectroscopy for chemical analysis) and can be used to determine the composition and actual chemical state of surfaces.
With this method it is possible to characterize a surface according to the sort of element present and in which oxidation state it exists. With the help of a ion-gun depth profiling is possible in an alternating sputter-measurement process.
Auger-Spectroscopy (named after French physicists Pierre Auger) is a complementary method to XPS. The sample is irradiated by an electron beam of well known energy. Due to this bombardment the surface under investigation itself ejects Auger electrons, which can be analysed according to their energy. As result the composition of the surface can be determined. In contrary to XPS, the Auger spectroscopy is most sensitive for the lighter elements, so that XPS and AES can be perfectly combined to get most sample information possible.
Schematic composition of the XPS/AES Spectrometer at Limedion
The Spectrometer consists out of a transfer system, sample manipulator,
x-ray gun (Al/Mg), Ion gun for depth profiling (not pictured), Electron-gun (not pictured)
By using the wide spectra of modern analytical methods and the excellent equipment present at Limedion, we will find an answer to all of your questions. The following methods are present in our labs:
According to requirements we use further methods e.g., High temperature infra-red camera, Ulbrich sphere, adhesion tester and salt spray cabinet.
In our branches surface analysis and material testing, we offer a certified quality management.
We are certified by the TÜV-CERT-certification bureau and satisfy the requirements according to DIN EN ISO 9001:2000.